Scanning Electron Microscope Supplies

The New York State College of Ceramics at Alfred University is seeking a vendor to provide scanning electron microscope supplies to its facility in Alfred, New York. The agency requires these supplies to characterize microstructures, fracture surfaces, powders, and elemental compositions of materials. The equipment must support an optional Electron Backscatter Diffraction feature to aid in grain size analysis, phase analysis, and determining grain orientation texturing of material samples. The requested supplies must meet specific technical parameters for an electron source, including a Schottky field emission gun, an accelerating voltage range, and a beam current range. The system must achieve specified high-vacuum resolution and support low-vacuum or variable pressure modes. For imaging, the agency requires a backscattered electron detector, alongside a stage with specified travel and tilt ranges, and a vacuum system with defined column vacuum levels and variable pressure ranges. Only United States organizations are eligible to bid on this opportunity. The selected vendor will perform the work offsite. The agency is currently looking for proposals to establish the budget for this procurement. All questions regarding this opportunity must be submitted no later than June 22, 2026.